Broad Ion Beam

A broad ion beam milling system

TECHNOORG - LINDA

SEMPREP SMART

Description

The Broad Ion Beam (BIB) uses an Argon ions to bombard the surface of materials to sputter away the damaged bulk surface, this can be extremely useful when removing induced mechanical stress from traditional polishing processes leaving samples ready for EBSD analysis. Samples are also able to be cross-sectioned if unsuitable for traditional fracturing/mounting and polishing.

Specification

  • Argon ion source
  • 4-16kV accelerating voltage, at 20-160µA
  • Optional Peltier cooled
  • Sample holders:
    • Surface polishing holder
      • 32mm diameter, 0-23mm height
      • Low angle tilting of 3-7°
      • Sample rotation or wide angle oscillation
      • EBSD ready preparation
    • Cross-sectional polishing holder
      • Both 30° and 90° cross-sectioning slopes
      • Wide cut function for large areas
      • Tilting 0.5 - 1.5°
      • Sample oscillation ±30 - 40°
A broad ion beam milling system

Are you interested in using this technique?

If you are interested in using this technique and would like further information please do not hesitate to get in touch.