Development and challenges of metal halide perovskite materials-based X-ray detectors
Since the discovery of X-rays by Wilhelm C. Röntgen in 1895, X-ray detection technology has been developed and frequently used for medical imaging diagnostics, security inspection and scientific research areas. X-ray direct detectors based on Cadmium Telluride (CdTe) or Cadmium Zinc Telluride (CZT) semiconductors with high Z which convert X-ray photons into electric charges have a superior resolution and are promising for high-energy Computed Tomography (CT) application. However substantial challenges in the fabrication and deployment of the active layer material have limited their widespread adoption.
In under a decade, inexpensive and chemically synthetic halide perovskite (PVK) materials-based optoelectronic devices including photovoltaic (PV) have achieved performance metrics rivalling those of crystalline silicon – the market-leading technologies . The same properties that make PVKs exceptional materials for PV also make them promising candidates for X-ray detection applications. PVKs have emerged as promising materials for direct X-ray detection demonstrating excellent mobility-lifetime products (µ
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