Transmission Electron Microscopy (TEM)
An image is formed by detecting the scattered electrons exiting from the specimen. TEM provides atomic resolution imaging providing the capability to reveal atom columns and microstructures of materials in sub-nanoscale. The system is also equiped with an Oxford Instruments Energy-Dispersive X-ray Spectroscopy (EDS) detector to provide information on the chemical composition of specific features. A combination of imaging, selected area diffraction analysis and chemical analysis using EDS allows detailed characterisation to be carried.
A JOEL 2000FX TEM is available within LMCC, this system is also equipped with an Oxford Instruments Energy-Dispersive X-ray Spectroscopy (EDS) detector.