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Under bump metallization technologies for high sensitivity spectroscopic X-ray detectors

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AUTHOR(S)
TITLE
JOURNAL/CONFERENCE
YEAR
VOL.
PAGE
J. Kaufmann, M. Desmulliez, Y. Tian, D. Price, M. Hughes, N. Strusevich, C. Bailey, C. Liu, and D. A. Hutt, Megasonic agitation for enhanced electrodeposition of copper Microsystem Technologies 2009 15 1245 - 1254
Y. Tian, C. Liu, D. A. Hutt, and B. Stevens, Electrodeposition of Indium for Bump Bonding 58th Electronic Components and Technology Conference 2008   2096 - 2100
Y. Tian, J. Kaufmann, C. Liu, D. A. Hutt, B. Stevens, and M. P. Y. Desmulliez Megasonic Enhanced Wafer Bumping Process to Enable High Density Electronics Interconnection 2nd Electronics System-Integration Technology Conference 2008   725 - 729
Y. Tian, D. A. Hutt, C. Liu, and B. Stevens, High Density Indium Bumping through Pulse Plating Used for Pixel X-Ray Detectors International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP) 2009   456 - 460
Y. Tian, C. Liu, D. A. Hutt, B. Stevens, D. Flynn, and M. P. Y. Desmulliez High Density Indium Bumping Using Electrodeposition Enhanced by Megasonic Agitation 11th Electronics Packaging Technology Conference 2009   31 - 35
   

 

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