Loughborough University
Leicestershire, UK
LE11 3TU
+44 (0)1509 222222
Loughborough University

Centre for Renewable Energy Systems Technology (CREST)

PV Materials & Devices

Thin Film optical and electrical characterisation

Varian Cary 5000 UV-IR-NIR Spectrophotometer

Quantitative measurement of Reflection and Transmission of light from materials as a function of wavelength (180-3300 nm)

   

 

UVISEL iHR320 Spectroscopic Ellipsometer

Non-destructive thin film characterization of materials with sub-nanometre accuracy obtained from the variation of polarization upon reflection or transmission of light.

   

 

Coherent Convergence (CCI)

Non-contact measurement technique for three dimensional surface metrology of thin films, giving thickness measurement with sub-nanometre resolution:

   

 

Ecopia HMS 3000 Hall System

Measures the electrical characteristics of a material by applying a magnetic field

   

 

HP LF Impedence Analyser Capacitance Voltage (C-V)

A technique for characterizing electrical properties of semiconductor materials and devices. The applied voltage is varied, and the capacitance is measured and plotted as a function of voltage.

   

 

AMBIOS XP-2 Profilometer

The XP-2 high-performance, stylus-type surface profiler provides precision surface topography measurements on a wide variety of substrates.